Better Stimulus Generation Through AI: Shaping the Future of Functional Verification

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Better Stimulus Generation Through AI: Shaping the Future of Functional Verification

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Episode Title: Better Stimulus Generation Through AI: Shaping the Future of Functional Verification Host: Harry Foster Guest: Tom Fitzpatrick, Industry Expert and Major Contributor to the Verification Academy Episode Summary Join host Harry Foster on Bugged Out as he welcomes industry veteran Tom Fitzpatrick to explore the transformative power of AI in functional verification. In this episode, Tom, author of the whitepaper "Better Stimulus Generation Through AI," delves into how Questa One Portable Stimulus Assist is revolutionizing stimulus generation. He compares traditional UVM approaches with the Portable Test and Stimulus Standard (PSS), discusses the evolving skill sets for engineers in an AI-driven world, and shares his vision for the future of verification. Tune in to understand why PSS is set to become the next major leap in productivity and abstraction for chip verification! Key Discussion Points: The Mission of Bugged Out: Harry introduces the podcast's goal: to bring candid conversations about finding and fixing bugs in complex chips. Meet the Expert: Jake Wiltgen, an expert in safety-critical systems, functional safety standards, and DFT, shares his extensive industry experience. What is DFT? Jake breaks down Design for Test in an accessible way, explaining its primary objective: to deliver high-quality, functionally correct silicon by building in capabilities to test for manufacturing defects. Jake's Journey into DFT: Discover how Jake got pulled into the world of DFT, driven by growing needs for fault-grading and addressing long-running serial simulations. Tackling the Tapeout Bottleneck: Learn why DFT sign-off often becomes a bottleneck during the critical period between netlist drop and tapeout, and how Questa One helps accelerate these essential simulations. Mega-Trends in DFT: Harry and Jake discuss the impact of technology scaling, design scaling, and system scaling on engineers, noting that the growing volume of DFT verification at both block and top levels is a major challenge. Evolving Challenges: Reliability and Aging Silicon: Explore how the objectives of DFT remain the same, but the methods have evolved dramatically due to embedded AI, autonomous vehicles, and angstrom-scale technology nodes. In-System Test (IST) in Practice: Jake paints a vivid picture of IST, illustrating its benefits in data centers (predicting silicon failure) and automotive (detecting safety-critical system failures before they cause harm). Resources Mentioned: White Paper: "Better Stimulus Generation Through AI" by Tom Fitzpatrick.

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